October 22, 2018 | Direct electron detection and x-ray analysis bring new possibilities for materials characterization in the EICN

October 22, 2018 | Direct electron detection and x-ray analysis bring new possibilities for materials characterization in the EICN

TECHNOLOGY CENTER ANNOUNCEMENT Direct electron detection and x-ray analysis bring new possibilities for materials characterization in the EICN October 22, 2018 Pictured above from left to right: 1) Thermo Fisher (FEI) Titan S-TEM housed in the CNSI EICN,  2) X-MaxN...