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Introduction to the Nova 600 DualBeam system: Scanning Electron Microscopy / Focused Ion Beam milling – fundamentals and capabilities
May 6, 2020 @ 10:30 am - 11:30 am
The UCLA NanoLab is happy to announce the next webinar event entitled: Introduction to the Nova 600 DualBeam system: Scanning Electron Microscopy / Focused Ion Beam milling – fundamentals and capabilities. The webinar will be accessible by Zoom on Wednesday, May 6th, 2020 from 10:30am-11:30am. Links to the webinar are provided below. The first 30 minutes will be a presentation provided by Dr. Noah Bodzin that will be followed by 30 minutes of Q&A.
Anyone who is interested in the FIB service at UCLA NanoLab is welcome to join. Please RSVP to jamie@seas.ucla.edu.
Join Zoom Meeting:
https://ucla.zoom.us/j/93987341491?pwd=T2I4VHZwUkd3bHUyMmRPWGI3RnVQQT09
Meeting ID: 939 8734 1491
Password: 123456