Nano and Pico Characterization Laboratory

An unprecedented collection of instrumentation for surface analysis at the nanoscale and beyond.



Anasys Instruments Seminar: “AFM-based infrared spectroscopy: nanoscale chemical analysis with submonolayer sensitivity” 

AppNano presentation and demonstration: VertisenseTM Scanning Thermal Microscopy Module for AFM

CNSI Core Labs Open House


Asylum Instruments presents: Smaller and Quieter: Ultra-High Resolution AFM Imaging with the Cypher


CNSI Core Labs Open House 


Bruker Nano presents: High-Speed, High-Throughput AFM Imaging

Asylum Research presents Cypher™ UCLA-CNSI Scan Tour/Workshop

CNSI Special Lecture: Criticality in brain’s physics and mind dynamics

Nanonics Imaging and Renishaw Present a Live Demo of AFM-Raman Imaging & Spectroscopy

Renishaw Presents “High-performance confocal Raman microscopy and imaging”

CNSI Core Labs Open House (2/17/2011)

Introduction to Confocal Raman Microscopy and Imaging (2/9/2011)

Nanoparticle Measurement and Cytometry using Microchannel Resonators 


Agilent Technologies: Novel Ways to See and Recognize Life

New Advances in SPM Probe Technology Workshop

CNSI-Veeco Seminar Series 2010 

High Resolution Imaging and Quantitative Nanomechanical Mapping

Scanning Probe Measurement with Various Application Modules–Electric, Magnetic, Thermal and Electrochemical

Scanning Probe Application in Life Sciences


Fall 2009 Workshop Series

Coverting AFM into an analytical tool: Material identification and characterizations based on nanoscale thermal analysis and imaging

Scanning Ion Conductance Microscopy: Non-intrusive, high resolution imaging of soft, wet and fragile surfaces

An introduction to combined Confocal Raman and Scanning Probe Microscopy An introduction to combined Confocal Raman and Scanning Probe Microscopy


Related Events

All CNSI Events

Art|Sci Center & Lab

Department of Chemistry & Biochemistry