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October 22, 2018 | Direct electron detection and x-ray analysis bring new possibilities for materials characterization in the EICN

Housed in the CNSI Electron Imaging Center for NanoMachines (EICN), the FEI Titan 80-300 scanning transmission electron microscope (STEM), is an advanced electron microscope capable of atomic-level imaging and analysis on a wide range of materials and nanostructures....

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