November 12, 2019 | Advances in AFM Mechanobiology, Nanomechanical, and Nanoelectrical Measurement Technology

Join us Tuesday, November 12, for a free one-day atomic force microscopy workshop at the California Nanosystems Institute at UCLA.

The California Nanosystems Institute at UCLA and Bruker are pleased to co-host a free, one day atomic force microscopy workshop in Los Angeles on November 12, 2019. Attendees will have the opportunity to learn about new advances in AFM mechanobiology, nanomechanical, and nanoelectrical measurement technology. There will also be demonstrations with Bruker’s Dimension FastScan AFM and Dimension Icon AFM, and JPK NanoWizard BioAFM. Additionally, lunch will be Provided. 

When: Tuesday, November 12th, 2019 9:30 am – 5 pm

Location: CNSI at UCLA, 570 Westwood Plaza, Building 114 Los Angeles, CA 90095

If you have any questions about this workshop, please contact Steve Ziegler by email at Stephen.Ziegler@bruker.com or by phone at 512.468.8998. To RSVP, please register by emailing events@cnsi.ucla.edu. Bruker website: https://www.bruker.com

For more information on the workshop agenda, please click here.

More on AFM Atomic Force Microscopy (AFM) is a type of scanning probe microscopy, a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen, that has a demonstrated resolution  on the order of fractions of a nanometer. Pioneered by Nobel Prize Winner Gerd Binnig in 1986, it’s become a paramount tool in assessing and analyzing nano samples. The Microscope utilizes a cantilever and a sharp probe to travel near the surface of the sample, sensing the deflection forces which in turn changes the reflection of the laser beam onto an array of photodiodes, thus developing an image with such resolution.